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Smoothing Graphene

Several methods have been reported for the growth of monolayer graphene into areas large enough for integration into silicon electronics. However, the electronic properties of the graphene are often degraded by grain boundaries and wrinkles. Lee et al. (p. 286, published online 3 April) showed that flat, single crystals of monolayer graphene can be grown by chemical-vapor deposition on silicon wafers covered by a germanium layer that aligns the grains. The graphene can be dry-transferred to other substrates, and the germanium layer can be reused for further growth cycles.

Abstract

The uniform growth of single-crystal graphene over wafer-scale areas remains a challenge in the commercial-level manufacturability of various electronic, photonic, mechanical, and other devices based on graphene. Here, we describe wafer-scale growth of wrinkle-free single-crystal monolayer graphene on silicon wafer using a hydrogen-terminated germanium buffer layer. The anisotropic twofold symmetry of the germanium (110) surface allowed unidirectional alignment of multiple seeds, which were merged to uniform single-crystal graphene with predefined orientation. Furthermore, the weak interaction between graphene and underlying hydrogen-terminated germanium surface enabled the facile etch-free dry transfer of graphene and the recycling of the germanium substrate for continual graphene growth.
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Supplementary Material

Summary

Materials and Methods
Figs. S1 to S14
References (3133)

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Published In

Science
Volume 344 | Issue 6181
18 April 2014

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Submission history

Received: 14 February 2014
Accepted: 20 March 2014
Published in print: 18 April 2014

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Acknowledgments

We are grateful to J.-H. Ahn, B. H. Hong, and Y. J. Song for helpful discussions. This work was supported by the National Research Foundation of Korea (NRF) grant funded by the Korean government (Ministry of Science, ICT, and Future Planning) (no. 2007-0054845). D.W. acknowledges support from the Basic Science Research Program through the NRF (no. 2009-0083540) and Samsung-SKKU graphene center.

Authors

Affiliations

Jae-Hyun Lee*
SKKU Advanced Institute of Nanotechnology, Sungkyunkwan University (SKKU), Suwon 440-746, Korea.
School of Advanced Materials Science and Engineering, Sungkyunkwan University, Suwon 440-746, Korea.
Research Center for Time-Domain Nano-functional Devices, Samsung Advanced Institute of Technology, Yongin 449-712, Korea.
Eun Kyung Lee*
Nano Electronics Laboratory, Samsung Advanced Institute of Technology, Yongin 449-712, Korea.
Won-Jae Joo*
Research Center for Time-Domain Nano-functional Devices, Samsung Advanced Institute of Technology, Yongin 449-712, Korea.
Nano Electronics Laboratory, Samsung Advanced Institute of Technology, Yongin 449-712, Korea.
Yamujin Jang
School of Advanced Materials Science and Engineering, Sungkyunkwan University, Suwon 440-746, Korea.
Research Center for Time-Domain Nano-functional Devices, Samsung Advanced Institute of Technology, Yongin 449-712, Korea.
Byung-Sung Kim
SKKU Advanced Institute of Nanotechnology, Sungkyunkwan University (SKKU), Suwon 440-746, Korea.
Research Center for Time-Domain Nano-functional Devices, Samsung Advanced Institute of Technology, Yongin 449-712, Korea.
Jae Young Lim
SKKU Advanced Institute of Nanotechnology, Sungkyunkwan University (SKKU), Suwon 440-746, Korea.
Research Center for Time-Domain Nano-functional Devices, Samsung Advanced Institute of Technology, Yongin 449-712, Korea.
Soon-Hyung Choi
School of Advanced Materials Science and Engineering, Sungkyunkwan University, Suwon 440-746, Korea.
Research Center for Time-Domain Nano-functional Devices, Samsung Advanced Institute of Technology, Yongin 449-712, Korea.
Sung Joon Ahn
Department of Physics, Sungkyunkwan University, Suwon 440-746, Korea.
Joung Real Ahn
SKKU Advanced Institute of Nanotechnology, Sungkyunkwan University (SKKU), Suwon 440-746, Korea.
Department of Physics, Sungkyunkwan University, Suwon 440-746, Korea.
Min-Ho Park
School of Advanced Materials Science and Engineering, Sungkyunkwan University, Suwon 440-746, Korea.
Cheol-Woong Yang
School of Advanced Materials Science and Engineering, Sungkyunkwan University, Suwon 440-746, Korea.
Byoung Lyong Choi [email protected]
Nano Electronics Laboratory, Samsung Advanced Institute of Technology, Yongin 449-712, Korea.
Sung-Woo Hwang [email protected]
Research Center for Time-Domain Nano-functional Devices, Samsung Advanced Institute of Technology, Yongin 449-712, Korea.
Nano Electronics Laboratory, Samsung Advanced Institute of Technology, Yongin 449-712, Korea.
Dongmok Whang [email protected]
SKKU Advanced Institute of Nanotechnology, Sungkyunkwan University (SKKU), Suwon 440-746, Korea.
School of Advanced Materials Science and Engineering, Sungkyunkwan University, Suwon 440-746, Korea.
Research Center for Time-Domain Nano-functional Devices, Samsung Advanced Institute of Technology, Yongin 449-712, Korea.

Notes

*
These authors contributed equally to this work.
†Corresponding author. E-mail: [email protected] (D.W.); [email protected] (S.-W.H.); [email protected] (B.L.C.)

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