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Direct Determination of Local Lattice Polarity in Crystals

K. A. Mkhoyan, P. E. Batson, J. Cha, W. J. Schaff, and J. SilcoxAuthors Info & Affiliations
Science
2 Jun 2006
Vol 312, Issue 5778
p. 1354
DOI: 10.1126/science.1124511
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Abstract

With current advances in sub-angstrom resolution scanning transmission electron microscopy (STEM), it is now possible to image directly local crystal structures of materials where dramatically different atoms are separated from each other at distances about or less than 1 angstrom. We achieved direct imaging of atomic columns of nitrogen in close proximity to columns of aluminum in wurtzite aluminum nitride by using annular dark field imaging in an aberration-corrected STEM. This ability allows direct determination of the local polarity in nanoscale crystals and crystal defects.

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Supplementary Material

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This work was partially supported by the Nanoscale Science and Engineering Initiative of the NSF grant no. EEC-0117770 and by the New York Office of Science, Technology, and Academic Research grant no. C020071.
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Information & Authors

Information

Published In

Science
Volume 312 | Issue 5778
2 June 2006

Copyright

American Association for the Advancement of Science.

Submission history

Received: 3 January 2006
Accepted: 31 March 2006
Published in print: 2 June 2006

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Notes

Supporting Online Material
www.sciencemag.org/cgi/content/full/312/5778/1354/DC1
Materials and Methods
Figs. S1 to S3
References

Authors

Affiliations

K. A. Mkhoyan*
School of Applied and Engineering Physics, Cornell University, Ithaca, NY 14853, USA.
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P. E. Batson
IBM Thomas J. Watson Research Center, Yorktown Heights, NY 10598, USA.
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J. Cha
School of Applied and Engineering Physics, Cornell University, Ithaca, NY 14853, USA.
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W. J. Schaff
School of Applied and Engineering Physics, Cornell University, Ithaca, NY 14853, USA.
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J. Silcox
School of Applied and Engineering Physics, Cornell University, Ithaca, NY 14853, USA.
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Notes

*
To whom correspondence should be addressed. E-mail: [email protected]

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